PROFESSIONAL SERVICE

EDITORSHIP

1.     Guest Editor, IEEE Transactions on CAD special issue on High Level Design Validation and Test, March 2001

2.     Guest Editor, IEEE Transactions on Reliability special issue on Fault-Tolerant VLSI Systems, December 2000

3.     Guest Editor, IEEE Design and Test of Computers special issue on On-Line VLSI Testing, October-December 1998

 

 

SELECTED PANELS/PRESENTATIONS

l     BMDO, Huntsville Alabama, Low cost approaches to radiation hardening, Sep 2000

l     IBM Crypto division, "Hardware implementation of AES symmetric block ciphers", Poughkeepsie, NY, Dec. 1999.

l     ASC Inc. New Hampshire, Computer aided design of fault tolerant VLSI systems, Nov 1999

l     Panelist, Fault Tolerance: Needs and Perspectives, IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Austin, Nov 1998

l     Department of Electrical Engineering, Cornell University, Ithaca, NY "Application specific programmable processors", April 1998

l     Department of Computer Science, Columbia University, New York, NY "Application specific programmable processors", April 1998

l     Panelist, On-Line Testing: Industrial Practices, IEEE International Test Conference, Washington D.C, Nov 1997

l     Lucent Bell Labs, Princeton, Low overhead on-chip techniques for on-line testing of VLSI Systems, Oct 1996

l     NEC C&C Research Lab, Princeton, Automatic Synthesis of Real Time VLSI Systems, Sep 1996

 

PROFESSIONAL ACTIVITIES

l     Program Committee Member and Area Coordinator of Fault Tolerant Systems, IEEE International Workshop on On-Line Testing, 2001

l     Program Committee Member, Design and Test in Europe, 2001

l     Program Committee Member and Area Coordinator of Fault Tolerant Systems, IEEE

l     Vice secretary, IEEE Test Technology Technical Council, 2000

l     International Workshop on On-Line Testing, 2000

l     Program Committee Member, Design and Test in Europe, 2000.

l     Steering Committee Member (finance chair), IEEE International High-Level Design Validation and Test Workshop, 2000

l     Session chair, IEEE VLSI Test Symposium, 2000

l     Steering Committee Member (publication chair), IEEE International High-Level Design Validation and Test Workshop, 1999

l     Vice secretary, IEEE Test Technology Technical Council, 1999

l     Program Committee Member, IEEE International Workshop on On-Line Testing, 1999

l     Program Committee Member, IEEE International conference on VLSI Design, 1998

l     Program Committee Member, IEEE International High-Level Design Validation and Test Workshop, 1998

l     Program Committee Member, IEEE International High-Level Design Validation and Test Workshop, 1997

l     Program Committee Member, IEEE International High-Level Design Validation and Test Workshop, 1996

l     Finance and Registration Chair, IEEE Symposium on Defect and Fault Tolerance in VLSI, 1996

l     Coordinator/Chair, SIGDA University Booth Program at Design Automation Conference, 1996

l     Coordinator/Chair, University Booth Program at IEEE International Conference on Computer Aided Design, 1996

l     Coordinator/Chair, University Booth Program at IEEE International Conference on Computer Aided Design, 1995

l     Program Committee Member, IEEE Workshop on Defect and Fault Tolerance in VLSI, 1995

l     Session chair, "High Level Synthesis of VLSI Circuits," IEEE Great Lakes symposium on VLSI, 1995

l     Coordinator/Chair, University Booth Program at IEEE International Conference on Computer Aided Design, 1994

 

REVIEWER

l     National Science Foundation (2001 CAREER awards selection panel)

l     IEEE Transactions on Computers

l     IEEE Transactions on CAD of Integrated Circuits and Systems

l     IEEE Transactions on VLSI Systems

l     IEEE Design and Test of Computers

l     ACM Transactions on Design Automation of Electronic Systems

l     IEEE Computer

l     IEEE International Symposium on Circuits and Systems

l     IEEE/ACM Design Automation Conference

l     IEEE/ACM International High-Level Design Validation and Test Workshop

l     IEEE International Conference on Computer Design

l     IEEE International Workshop on Defect and Fault Tolerance in VLSI

l     IEEE/ACM Great Lakes Symposium on VLSI

MEMBER

l     IEEE Computer Society and IEEE Test Technology Technical Council

l     Association of Computing Machinery and ACM Special Interest Group on Design Automation